Mettler Toledo Product Inspection Group has expanded its X6 Series with the launch of the X56 DXD+, a dual-energy photon-counting X-ray inspection system featuring artificial intelligence capabilities. Designed for packaged food applications, the system can detect low-density or overlapping textures. The X56 DXD+ uses the company's DXD+ detector technology and Advanced Material Discrimination Pro software. Chris Plant, head of market management at Mettler Toledo, said: “The launch of the X56 DXD+ expands our X6 Series, offering a comprehensive suite of inspection solutions tailored to modern food manufacturing". "With its dual energy photon-counting capabilities, the X56 DXD+ delivers new levels of detection performance in complex packages across single and multi-lane formats.