A framework for mapping atoms in amorphous materials in three dimensions A new computational framework maps 3D atomic positions in amorphous materials, achieving full accuracy for silica using simulated electron microscopy data. (Nanowerk News) Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the three-dimensional positions and elemental identities of atoms in amorphous materials. The team used algorithms to analyze rigorously simulated imaging data of nanoparticles — so small they’re measured in billionths of a meter. So computational microscopy, including AET and ptychography, is poised to provide a long-lasting boost to 3D atomic imaging. What’s more, unlocking the 3D structure of amorphous materials is expected to drive both technological innovation and new insights into fundamental aspects of nature.